Inspection
Wafers – Diced Wafers – Singulated Die – Modules & More!
(AI Generated video)
Rapid ROI
Improve yield – Lower your Operating costs with a rapid Return on Investment.
Automation
Options to fit easily into your global production needs, improving productivity.
Consistency
Reduce operator interpretation. Get accurate and reviewable results for your production and quality needs.
Let us show you with an online demo
Scrutiny Remote
Remote Inspection
Spot Process issue early
Scrutiny Core
Camera + Software
Integrate to anything
Scrutiny Total
Inc. Robotics/Handling
Full turnkey solution
Integrate into your test floor
Combine or enhance your electrical wafer map data. Review tools ensure efficient monitoring and archive and retrieval.
Typical Defects
Dirt, Debris, Scratches, Probe mark, Ball analysis, Process defects, Plus many more
Instantly identify defect trends or misprocessing.
Incoming & Outgoing Quality Assurance
“Point Of Interest” sub-routines automate and record details at specific locations. Incoming or outgoing specifications are met ensuring quality.
Spot Checks and archive for quality monitoring
You will now have a record for archive and review purposes – you decide what you keep and for how long!
Multi-camera lens options ensure your needs are met in terms of resolution and field size..
Review or re-process results from anywhere
Our network and remote architecture means you don’t have to be in front of a machine to review or reprocess results – you can be in the comfort of your desk or even working from home.
“The ability to view, rework and re-run tests from anywhere is of huge benefit to management as well as operators”
“Using the systems as a production filter, means we manually review less product, speeding everything up”
“Operators are happier they now spend time spotting and counting defects on mainly good / passed die”