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As everyone has different needs, the best solution is call!

The following is a summary of most often asked questions

Q1 : Why was the system developed when there are lots of inspection systems out there?

In a word – Cost!
Experience with other inspection systems meant we had customers wanting to automate inspection but could not afford the expense of fully loaded systems. Most customers only wanted to relieve microscope operator loading and improve consistency at the same time.

Q2: What can I see ?

This is dependent on what camera lens combination you chose. The easiest way to determine if the system is right for you is to send us a sample. More often, its the contrast rather than the physical size defects. This also means different lighting may be chosen. To date we have had good results with normal incidence white light which produces less shadowing or more consistent images. We have tried Red Blue etc in several circumstances. We normally run the fist demo for free which can run remotely as everything has been designed for remote access. Within a few minutes you will see how we address various issues.

Q3: How fast is the system

The system was designed to process images in the time a wafer prober takes to step from one location to another. There is always a “gate” in any processing but we have tests that can run in a few milliseconds through to much longer depending on complexity. The stepping time of the robot (or stage speed on a wafer prober) tends to be the limiting gate.

Stopwatch speed (the time between two points of the process) is not the best metric for measuring overall productivity, and the whole factory automation and quality control matrix. Call us for a detailed discussion and we can help identify the best way to approach the problem.

Q4: What defects can you detect

Right out of the box, the software gives you the tools to define your own testing regime. Our standard testing methods go along way to getting you started. We can help of course, but you have the ability to modify any test or create your own. We have different algorithms that you can apply either individually or sequentially, either to all, or different parts of any device under test. You have the ability to define areas and sensitivities etc. on a case by case basis.

Think of our software as your own detection tool kit that once defined and fixed, becomes a quality filter applied time after time after time.

Q5: Can you integrate wafer maps, result maps and handle data

Yes – we have lots of experience in data handling and manipulation which is why we made our system the way we have. Every customer is different, so we have made it easy to integrate into whatever test floor or Q/A strategy you want to adopt. Integration into other robotics or cell controllers is always possible as long as we can get a simple signal from/to whatever we are integrating into.
Contact us to discuss your needs.

Q6: Can I move the software to a different PC

Yes you can. The core program is dongle protected however results and images etc can be stored on any network if needed. The system is designed to allow you to define the paths for both the software locations and the data files.