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FAQ’s

As everyone has different needs, the best solution is to call!


The following is a summary of most often asked questions

Q1 : Why was the system developed when there are lots of inspection systems out there?

In a word – Cost!
Experience with other inspection systems meant we had customers wanting to automate inspection but could not afford the expense of fully loaded systems. Most customers only wanted to relieve microscope operator loading and improve consistency at the same time. We developed the tool to work on wafers, diced wafers and waffle packs – the later two having very special needs

Q2: What can I see ?

This is dependent on what camera lens combination you chose. The easiest way to establish what combination is right for you is to send us a sample. We are more than happy to sign NDA’s (non-disclosure agreements).
Most often, its the contrast rather than the physical size of defects that determine effectiveness . This also means different lighting may be chosen. We normally run the first demo free of charge which you can log into and see the system working on your products. Everything has been designed for remote access so within a few minutes you will see how we address various issues. Additional tests can be run on a chargeable basis

Q3: How fast is the system

The real question is how the tool integrates into your workflow. We have carried out cost calculations and are happy to go through this with you on case by case basis. As raw data, the system was designed to process images in the time a wafer prober takes to step from one location to another. It depends on filed size resolution etc. There is always a “gate” in any processing step but we have tests that can run in a few milliseconds through to much longer depending on complexity. The stepping time of the robot (or stage speed on a wafer prober) can be the limiting gate.

Stop-watch speed (the time between two points of the process) is not the best metric for measuring overall productivity, and the whole factory automation and quality control matrix. Call us for a detailed discussion and we can help identify the best way to approach the problem.

Q4: What defects can you detect

Right out of the box, the software gives you the tools to define your own testing regime. Our standard testing methods go along way to getting you started. We can help of course, but you have the ability to modify any test or create your own. We have different algorithms that you can apply either individually or sequentially, either to all, or different parts of any device under test. You have the ability to define areas and sensitivities etc. on a case by case basis.

Think of our software as your own detection tool kit that once defined and fixed, becomes a quality filter applied time after time after time.

Q5: Can you integrate wafer maps, result maps and handle data

Yes – we have lots of experience in data handling and manipulation which is why we made our system the way we have. Every customer is different, so we have made it easy to integrate into whatever test floor or Q/A strategy you want to adopt. Integration into other robotics or cell controllers is always possible as long as we can get a simple signal from/to whatever we are integrating into.
Contact us to discuss your needs.

Q6: Can I move the software to a different P C or access results remotely

Yes you can. The core program is dongle protected however results and images etc can be stored on any network if needed. The system is designed to allow you to define the paths for both the software locations and the data files. To allow full remote working or review would require additional PC licences

Q7: Can you cope with large chips or wafer scale features

In a word YES – the software has been designed to cope with all aspects of inspection – and if we encounter new needs we work with customers to develop a good solution for them. These are too numerous to mention here so please contact us for a technical discussion.